The LCN currently has two JPK CellHesion 200 systems primarily for measuring cell to cell or cell to substrate interactions. It can also quantify cell elasticity and response to mechanical stress.

The Nanowizard 4 combines fast scanning with high resolution at scan sizes up to 100um and is designed to provide mechanical and thermal stability on inverted optical microscopes for long term imaging.

An Everbeing EB-6 high precision probe station is available for DC wafer probing. Four low noise, high precision probes are available along with a microscope and digital camera. The EB-6 was donated to the LCN by Everbeing in January 2017.

The Bruker Dimension FastScan AFM allows imaging rates up to frames/second without sacrificing resolution from subnanometer to 100's of nanometers in height.

The LCN is equipped with two JPK Nanowizard ULTRA Speed AFMs for fast scanning at up to 300Hz line rate in air and liquid at high resolution.

The LCN currently has three Bruker MultiMode 8 AFMs which are equipped with an E scanner or J scanner (with heater) and uses the unique PeakForce Tapping™ technology to provide new information, faster results and greatly improved ease of use.

This instrument is designed for rapid access to images for cleanroom samples with no sample prepartion.  Samples can range from small pieces, up to 100mm wafers mounted on dedicated wafer holders.  It has a LaB6 source and a resolution of 2nm.

This is the FFP5000 model of probe equipped with an external probe and sample holder.  The stage is capable of accepting wafers up to 100mm diameter and has indexed locations to permit reproducable positioning.

This equipment has a spectroscopic source and operates between 400 and 840nm.  The software is fully configurable to enable the measurement thickness and optical properties of the thin transparent films encountered within the cleanroom such as Silicon Oxide, Nitride and Oxynitride, organic layers

The DektakXT is the 10th generation, and latest, profiler from the Dektak Range.  It is fast, and has an automated XY Theta sample stage.  Vertical reproducibility is 5 Angstrom, and it can measure steps from nm to 1mm deep.  It can handle samples that are up to 35mm thick, and up to 300mm in dia