JPK Nanowizard ULTRA Speed

JPK Nanowizard ULTRA Speed
Equipment manager:
Richard Thorogate
Equipment manufacturer:
JPK
Equipment model:
Nanowizard ULTRA Speed
Deputy equipment manager:
Matthew Lougher
Equipment Location:

The LCN is equipped with two JPK Nanowizard ULTRA Speed AFMs for fast scanning at up to 300Hz line rate in air and liquid at high resolution. It comes equipped with QITM mode for quantitative material property mapping and the ability to correlate optical microscopy and AFM images with DirectOverlayTM.

Features:

  • High resolution imaging of biological and soft samples in air or liquid
  • Up to 300 lines/sec in air or liquid
  • Closed loop atomic resolution
  • Low noise Vortis controller
  • Acoustic isolation hood
  • AC modes with phase detection, Q control and DirectDrive cantilever excitation
  • Contact mode with lateral force imaging
  • QI mode
  • Direct Overlay
  • Force distance spectroscopy and force mapping
  • Microrheology
  • Olympus IX73 inverted microscopes (one with FITC and TRITC filter sets)
  • One system equipped with motorised stage and petri dish heater

 

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