Focused Ion Beam (FIB)

Focused Ion Beam

Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials.

An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead. 

Research Poster PDFs
Focused Ion Beam (FIB)

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Figure: Niobium SQUID fabricated using FIB. The device incorporates 150 nm wide nanobridges as the active Josephson elements. [courtesy Ed Romans]