JEOL F200 Transmission Electron Microscope

JEOL F200 TEM
Equipment manufacturer
JEOL
Equipment model
F200
Equipment technique
  • Quad lens condenser system
  • Advanced scan system
  • Pico stage drive for ultra-fast, high-precision movement of field-of-view
  • SpecPorter automated sample holder transfer system
  • Cold FEG with narrow energy spread
  • Dual Silicon Drift Detectors
  • Intuitive and efficient operation
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