AFM Training
We organise training sessions to make new users sufficiently familiar with an AFM to safely characterise surfaces on one or more of our AFMs.
<p>The design of the Multimode has been optimised for the highest resolution, including a short mechanical path, low vibration construction and ultra low noise electronics. It features the J, E and A scanner options to tailor the system to the individual needs. For example, the 'J' scanner has a scan range up to 125 µm in XY and 6 µm in the Z, whereas the 'A' scanner has a 0.4 µm scan range in all dimensions.</p>
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<p>Modes:</p>
<ul>
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Contact mode(air/liquid)</li>
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Tapping mode (air/liquid)</li>
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Phase imaging</li>
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Lateral force mode</li>
<li>
Kelvin Probe Microscopy</li>
<li>
MFM</li>
<li>
CAFM / TUNA</li>
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SCM</li>
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SThM</li>
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Force imaging</li>
<li>
Fluid cell option</li>
</ul>
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We organise training sessions to make new users sufficiently familiar with an AFM to safely characterise surfaces on one or more of our AFMs.