Dimension 3100 AFM

<p>The Dimension 3100 utilises standard and advanced SPM imaging modes for measuring semiconductor wafers, lithography masks, magnetic media, biomaterials, optics and other materials. The sample stage&nbsp; will allow large sample sizes (up to a 6 inch wafer) with a scan size up to 100 &micro;m in the X &amp; Y and 6 &micro;m in the Z.</p>
<p>&nbsp;</p>
<p>&nbsp;</p>
<p>&nbsp;</p>
<p>&nbsp;</p>
<p>&nbsp;</p>
<p>Applications</p>
<ul>
<li>
&nbsp;&nbsp;&nbsp;&nbsp; Electronic materials</li>
<li>
&nbsp;&nbsp;&nbsp;&nbsp; Thin films</li>
<li>
&nbsp;&nbsp;&nbsp; MEMS/NEMS</li>
<li>
&nbsp;&nbsp;&nbsp; Advanced materials</li>
<li>
&nbsp;&nbsp;&nbsp; Tribology</li>
<li>
&nbsp;&nbsp;&nbsp; Biotechnology</li>
</ul>
<p><br />
Modes:</p>
<ul>
<li>
&nbsp;&nbsp;&nbsp; Contact mode</li>
<li>
&nbsp;&nbsp;&nbsp; Tapping mode</li>
<li>
&nbsp;&nbsp;&nbsp; Phase imaging</li>
<li>
&nbsp;&nbsp;&nbsp; Lateral force mode</li>
<li>
&nbsp;&nbsp;&nbsp; Force imaging</li>
<li>
&nbsp;&nbsp;&nbsp; MFM</li>
<li>
&nbsp;&nbsp;&nbsp; Electric techniques (CAFM, Tuna)</li>
<li>
&nbsp;&nbsp;&nbsp; Closed loop option</li>
</ul>

CLOSE X