Bruker Icon Dimension Atomic Force Microscope

Bruker Dimension Icon Atomic Force Microscope
Equipment manager:
Bill Luckhurst
Equipment manufacturer:
Equipment model:
Dimension Icon
Equipment technique:
Equipment Location:

 Atomic force microscope with tapping, resonance and contact modes.

  • State of the art AFM from Bruker features 100 micron x-y scans with 8.5 micron z scan.
  • This high performance instrument uses the latest ScanAsyst and Peak Force Tapping modes in either air or liquid.
  • Users have the options of using nano electrical and nano mechanical experimental set ups.
  • The system retains an environmental chamber ,motor controlled precision sample stage and a balanced air table to minimise floor born vibration reaching the stage and Piezos.

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