Bruker Icon Dimension Atomic Force Microscope

Bruker Dimension Icon Atomic Force Microscope
Equipment manager
Bill Luckhurst
Equipment manufacturer
Equipment model
Dimension Icon
Equipment technique
Equipment Location

 Atomic force microscope with tapping, resonance and contact modes.

  • State of the art AFM from Bruker features 100 micron x-y scans with 8.5 micron z scan.
  • This high performance instrument uses the latest ScanAsyst and Peak Force Tapping modes in either air or liquid.
  • Users have the options of using nano electrical and nano mechanical experimental set ups.
  • The system retains an environmental chamber ,motor controlled precision sample stage and a balanced air table to minimise floor born vibration reaching the stage and Piezos.

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