Equipment manager
Bill Luckhurst
Equipment manufacturer
Bruker
Equipment model
Dimension Icon
Equipment technique
Equipment Location
Atomic force microscope with tapping, resonance and contact modes.
- State of the art AFM from Bruker features 100 micron x-y scans with 8.5 micron z scan.
- This high performance instrument uses the latest ScanAsyst and Peak Force Tapping modes in either air or liquid.
- Users have the options of using nano electrical and nano mechanical experimental set ups.
- The system retains an environmental chamber ,motor controlled precision sample stage and a balanced air table to minimise floor born vibration reaching the stage and Piezos.
For more information please contact lcn@kcl.ac.uk