Dr Victoria Bemmer
The AFM facility in the department of Materials at Imperial College London consists of two instruments; a Bruker Innova and an Asylum MFP-3D classi.
The Bruker Innova is available for routine analysis of samples and is able to probe the topography of the sur-face using standard tapping and contact modes, as well as electrical properties in conductive AFM (C-AFM) mode.
The Asylum MFP-3D In addition to standard topogra-phy allowes users to investigate electrical (KPFM), mag-netic (MFM), piezoelectric (PFM) and nanomechanical properties (force mapping and AM-FM).
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