Equipment

Dimension FastScan
The LCN has recently acquired a Bruker Dimension FastScan AFM which allows imaging rates up to frames/second without sacrificing resolution from...
JPK Nanowizard 3 ULTRA speed
The LCN is equipped with a JPK Nanowizard 3 ULTRA speed AFM for fast scanning at up to 150Hz line rate in air and liquid at high resolution. It comes...
Multimode 8 AFM
The LCN currently has three Bruker MultiMode 8 AFM's which are equipped with an E scanner or J scanner with heater and uses the unique PeakForce...
An Image of Orion NanoFab
Carl Zeiss ORION NanoFab - A Multibeam Ion (Helium & Neon) Microscope for Sub-10nm Nanostructuring Main Features: Fast machining of sub-10...
Anodic Bonder Image
AML-AWB Aligner-Wafer Bonder Platform Overview: • Unique In-situ alignment system (X,Y,Z & θ) • 1-5 micron accuracy depending on options &...
This instrument is a single wavelength automatic Ellipsometer. It is used to measure thin transparent films on Silicon such as Silicon Oxide, and...
SEM
This instrument is designed for rapid access to images for cleanroom samples with no sample prepartion.  Samples can range from small pieces, up to...
Four point Probe
This is the FFP5000 model of probe equipped with an external probe and sample holder.  The stage is capable of accepting wafers up to 100mm diameter...
A306 Metal Box
This equipment has four independent source positions allowing multiple layers to be deposited without breaking vacuum.  The maximum sample size is...
Ellipsometer
This equipment has a spectroscopic source and operates between 400 and 840nm.  The software is fully configurable to enable the measurement thickness...
DektakXT
The DektakXT is the 10th generation, and latest, profiler from the Dektak Range.  It is fast, and has an automated XY Theta sample stage.  Vertical...
Ebeam resist coating
A spin coater with chucks for samples from 3x3mm up to 150mm diameter  and a precison vacuum holddown hotplate are dedicated for use with materials...

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