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Focused Ion Beam (FIB)
Focused ion beam, also known as FIB, is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field for site-specific analysis, deposition, and ablation of materials.
An FIB setup is a scientific instrument that resembles a scanning electron microscope (SEM). However, while the SEM uses a focused beam of electrons to image the sample in the chamber, an FIB setup uses a focused beam of ions instead.
Research Poster PDF
Focused Ion Beam (FIB)
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| Niobium SQUID fabricated using FIB. The device incorporates 150 nm wide nanobridges as the active Josephson elements. [courtesy Ed Romans] |
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