SEM/FIB Lab

About the instrument
The Carl Zeiss XB1540 “Cross-Beam” focussed-ion-beam microscope at London Centre for Nanotechnology in University College London is a unique instrument in a unique location. The instrument is equipped not only with an in situ field-emission scanning electron microscope for gallium-free imaging, but also an in situ low-voltage argon-ion-miller for gallium-free nanofabrication. The instrument is located in a brand new purpose-built class 10,000 cleanroom in the basement level of the London Centre for Nanotechnology.

Access to the instrument
The SEM/FIB is available for use by researchers outside of the LCN, please select the correct category for information on access:

• Researchers from University College London or Imperial College
  please use the booking sheet to check availability and follow instructions therein.
• Researchers from other UK Higher Education institutions
  You may apply for time on this instrument under the EPSRC Access programme.
• Other users
  Please email Dr Paul Warburton (p.warburtonee.ucl.ac.uk) with an outline of your project and request a quote.

Technical specifications and key features

• Ultra high resolution FESEM with unique GEMINI column
• High performance CANION FIB column
• CrossBeam® operation: high resolution live imaging during milling and polishing
• Optional multi-channel gas injection system for material deposition and enhanced or selective etching
• Image archiving, networking and hardcopy solutions from the integral Windows® operating system