AFM Lab

Scanning probe instrumentation
The London Centre for Nanotechnology (LCN) offers an extensive suite of scanning probe microscopes, including a Veeco Multimode IV, a Veeco Dimension 3100 (2x), a JPK Nanowizard (2x), a Topometrix and several ultra-high vacuum scanning tunnelling microscopes [STM page]. Several atomic force microscopes (AFMs) are set up for a broad range of tasks under ambient conditions, from surface-roughness characterisation to functional imaging at the (sub-)nanometre scale.

Access to the AFMs
The Veeco Multimode, a Dimension 3100 and a JPK Nanowizard are available for use by researchers outside of the LCN. Please select the correct category for information on access:

• Researchers from University College London or Imperial College
  Please use the booking sheets to check availability and follow instructions therein.
  
• Other users
  Please email an outline of your project and an approximate schedule for when and how long you wish to use an AFM.

First-time users will be requested either for evidence of their skills in operating the instrument, or to follow an LCN-based training on the AFM.